The 10th National Symposium on Ground Improvement
نویسندگان
چکیده
منابع مشابه
10th FIG International Symposium on Deformation Measurements
Compared to opencut mining, underground coal mining is more common in Australia due to its lesser impact on the environment. Although there are several underground mining methods, such as the longwall, pillar, bord, and miniwall, longwall mining is the most commonly used method due to its high efficiency. However, longwall mining does lead to significant ground subsidence. Mining subsidence is ...
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In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra low supply voltages to find the best topology for subthreshold operation. To support the theoretical discussions different topologies are analyzed and simulated. Various aspects of flip-flop circuits are described in det...
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In this paper, we propose a novel statistical decap allocation method to reduce the voltage drop noise in the presence of variational leakage current sources. The new method can derive the closed form of decoupling capacitance (decaps) in terms of variational parameters from the variational leakage currents. It treats the deterministic decap method as a black box and can work with any existing ...
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On-chip circuit aging sources, like negative bias temperature instability (NBTI), hot-carrier injection (HCI), electromigration, and oxide breakdown, are reducing expected chip lifetimes. Being able to track the actual aging process is one way to avoid unnecessarily large design margins. This work proposes a sensing scheme that uses sets of reliability sensors capable of accurately tracking NBT...
متن کامل10th Int'l Symposium on Quality Electronic Design
This paper describes PETE, a tool that has been developed for circuit/system level evaluation of nanoscaled devices. The motivation behind developing this tool is the fact that traditional device metrics like CV/Ion, Ioff or CVf can no longer capture the true potential of semiconductor devices and underestimate or overestimate system level performance. At the same time, the development and depl...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 2013
ISSN: 0514-5163,1880-7488
DOI: 10.2472/jsms.62.164